Atomic Force Microscope

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first atomic force microscope (also abbreviated as AFM) in 1986. The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale
To download Atomic force microscopy (AFM)
http://www.easy-share.com/1909790012/Atomic Force Microscope.ppt