Invented by Alois Senefelder in Germany in 1798
Fundamentally new printing technology
Mechanical Plano graphic process in which the printing and non-printing areas of the plate are all at the same level
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy with demonstrated resolution on the order of fractions of a nanometer,more than 1000 times better than the optical diffraction limit.
No comments:
Post a Comment